IC Failure Analysis Lab - Diagnostic, Failure Analysis and Reliability Testing of Semiconductors IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center 949-244-1337 
IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center
IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center
IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center
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IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center

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IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center
IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center
 

IC Failure Analysis Lab

IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center IC Failure Analysis Lab is a privately held company located in Orange County, California. IC Failure Analysis Lab Services' personnel have decades of collective experience in microanalysis and process analysis.

These experiences have enabled us to bring high quality and low cost Failure Analysis, Microsurgery, and Reliability testing services in semiconductor, electronics, aerospace, military, and computers to our customers through pre-qualified labs.

Our state-of-the-art equipment and breadth of skilled workers is unmatched in America and Asia.

Our turnkey services can save up to 45% of your current FA and Reliability testing costs in North America.

Price Guarantee: We guarantee our price to be lower than any North American lab or we will gladly beat their price by 20% of the difference.

IC Failure Analysis Lab will be pleased to assist you in the following areas:

  • Decapsulation by chemical wet etch / Laser
  • Delayering / Parallel Lapping
  • EMMI (Emission Microscopy)
  • FIB (Focused Ion Beam) Precision Cutting
  • InGaAs EMMI
  • I-V (Curve Trace) measurement
  • Mechanical Polishing
  • OBIRCH (Optical Beam Induced Resistance Change)
  • OM(Optical Microscope)
  • OP(Optical Profiler)
  • SAM (Scanning Acoustic Microscopy) or SAT(Scanning Acoustic Tomography)
  • SEM (Scanning Electron Microscopy)
  • SIMS (Secondary Ion Mass Spectrometry)
  • TEM (Transmission Electron Microscope)
  • X-Ray (Standard / 2-D) Examination
  • X-Ray (3-D) Examination
IC Failure Analysis Test Diagnostics Semiconductor Circuit Board Electronics Failure Center
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